MOFFAT, I. U. A Probabilistic Model for Predicting Examination Performance: A Binary Time Series Regression Approach. International Journal of Sciences: Basic and Applied Research (IJSBAR), [S. l.], v. 16, n. 2, p. 375–394, 2015. Disponível em: https://gssrr.org/index.php/JournalOfBasicAndApplied/article/view/3469. Acesso em: 3 jul. 2024.