KANG JIN GANG; ANG LING WEAY. Systematic Review: Advances in Machine Learning Frameworks for Predicting Patent Infringements. International Journal of Sciences: Basic and Applied Research (IJSBAR), Jordan, v. 76, n. 1, p. 83–91, 2025. Disponível em: https://gssrr.org/JournalOfBasicAndApplied/article/view/17329. Acesso em: 23 dec. 2025.